Patrick Meyer, PhD
Vice President of Psychometrics and Analytics

Patrick Meyer manages a team of psychometricians, data analysts, and technical writers responsible for large-scale assessments at NWEA. His team oversees several high-stakes state assessments and through-year programs, MAP Growth assessments, and MAP Reading Fluency. Dr. Meyer’s research interests include item response theory, teaching observation measures, and psychometric software design and development. He is the inventor and lead developer of jMetrik, an open-source software program used in over 20 countries.
Dr. Meyer has authored two books and published over 20 articles in peer-reviewed journals such as the Journal of Educational Measurement, Applied Psychological Measurement, and Educational and Psychological Measurement. He has conducted 25 standard-setting workshops in the licensure and certification field and hosted numerous workshops on psychometric theory and the use of jMetrik for data analysis. Prior to joining NWEA in 2018, he was an associate professor with tenure in the School of Education and Human Development at the University of Virginia, where he taught courses in educational measurement and applied statistics. He began his academic career in 2004 as an assistant professor at James Madison University’s Center for Assessment and Research Studies. Dr. Meyer holds a PhD in educational psychology and research from the University of South Carolina.