J. Patrick Meyer, PhD

Director of Psychometric Solutions

Dr. J. Patrick Meyer, Ph.D. is Director of Psychometrics for products such as MAP Growth, MAP Skills, and MAP Reading Fluency. Prior to joining NWEA in 2018, he was an Associate Professor with tenure in the Curry School of Education at the University of Virginia, where he taught courses in educational measurement and applied statistics. Patrick began his academic career in 2004 as an Assistant Professor at James Madison University’s Center for Assessment and Research Studies.

Patrick’s research interests involve item response theory, vertical scaling, parameter invariance, and evaluating the psychometric characteristics of teaching measures. He is also the inventor and lead developer of jMetrik, an open-source software program that is in use in over 20 countries. He has authored two books. Understanding Measurement: Reliability provides a comprehensive review of test score reliability. His second book, Applied Measurement with jMetrik, serves as a user manual for his software and a guide for conducting an operational psychometric analysis. Patrick has published over 20 articles in peer-reviewed journals such as the Journal of Educational Measurement, Applied Psychological Measurement, and Educational and Psychological Measurement. He has conducted 25 standard setting workshops in the licensure and certification field, and numerous online and face-to-face workshops on psychometric theory and using jMetrik for data analysis.